Approximate methods for the optical characterization of inhomogeneous thin films: Applications to silicon nitride films

Warning

This publication doesn't include Faculty of Economics and Administration. It includes Faculty of Science. Official publication website can be found on muni.cz.
Authors

OHLÍDAL Ivan VOHÁNKA Jiří FRANTA Daniel ČERMÁK Martin ŽENÍŠEK Jaroslav VAŠINA Petr

Year of publication 2019
Type Article in Periodical
Magazine / Source Journal of Electrical Engineering
MU Faculty or unit

Faculty of Science

Citation
Web https://doi.org/10.2478/jee-2019-0037
Doi http://dx.doi.org/10.2478/jee-2019-0037
Keywords ellipsometric parameters;inhomogeneous thin films;optical characterization;reflectance
Description In this paper the overview of the most important approximate methods for the optical characterization of inhomogeneous thin films is presented. The following approximate methods are introduced: Wentzel-Kramers-Brillouin-Jeffreys approximation, method based on substituting inhomogeneous thin films by multilayer systems, method based on modifying recursive approach and method utilizing multiple-beam interference model. Principles and mathematical formulations of these methods are described. A comparison of these methods is carried out from the practical point of view, ie advantages and disadvantages of individual methods are discussed. Examples of the optical characterization of three inhomogeneous thin films consisting of non-stoichiometric silicon nitride are introduced in order to illustrate efficiency and practical meaning of the presented approximate methods.
Related projects:

You are running an old browser version. We recommend updating your browser to its latest version.